2022
DOI: 10.1021/acs.langmuir.2c01011
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Complementary Resistive Switching Behavior in Tetraindolyl Derivative-Based Memory Devices

Abstract: Complementary resistive switching (CRS) devices are more advantageous compared to bipolar resistive switching (BRS) devices for memory applications as they can minimize the sneak path problem observed in the case of BRS having a crossbar array structure. Here, we report the CRS behavior of 1,4bis(di(1H-indol-3-yl)methyl)benzene (Indole1) molecules. Our earlier study revealed that Au/Indole1/Indium tin oxide (ITO) devices showed BRS under ambient conditions. However, the present investigations revealed that whe… Show more

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Cited by 8 publications
(14 citation statements)
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References 62 publications
(162 reference statements)
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“…The corresponding I – V curve reveals that the device retains its ON state even after the removal of the external power supply (Figure S5 shown in the Supporting Information). This confirms that the present IC-based device shows nonvolatile memory behavior. , …”
Section: Resultssupporting
confidence: 89%
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“…The corresponding I – V curve reveals that the device retains its ON state even after the removal of the external power supply (Figure S5 shown in the Supporting Information). This confirms that the present IC-based device shows nonvolatile memory behavior. , …”
Section: Resultssupporting
confidence: 89%
“…This confirms that the present IC-based device shows nonvolatile memory behavior. 58,59 Information about the reproducibility and sustainability of the designed memory devices is required for probable practical and commercial applications. 53,60 Reproducibility of the designed memory device was checked in several consecutive scanning cycles in the direction 0 3a,b).…”
Section: Electrical Characterizationsmentioning
confidence: 99%
“…The slope of the curve is 1.94, close to 2, indicating that the conduction can be described by the Mott-Gurney (MG) law I ∝ V 2 [40]. This suggests that the current through the Al/Albumen/ITO device is initially governed by the injected charge carriers and trap centers in the active layer [22]. When the CRS device switches to the positive LRS (PLRS), the experimental data can be well fitted with the linear relationship ln(I) ∼ V 1/2 , as shown in figure 4(b).…”
Section: The Crs Mechanism Discussionmentioning
confidence: 85%
“…The memory performance was further evaluated by conducting the cycling endurance characteristic test by applying alternate positive and negative voltage sweeps on the Al/Albumen/ITO device [13,17,22]. Figure 2(d) shows the evolution of LRS and HRS in 140 consecutive switching cycles, exhibiting a favorable and robust memory margin of 10 2 , significantly higher than the commercial standard (10) [10].…”
Section: The Crs Performance Of the Al/albumen/ito Devicesmentioning
confidence: 99%
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