Compensating Local Magnifications in Atom Probe Tomography for Accurate Analysis of Nano-Sized Precipitates

Lawitzki, Robert; Stender, Patrick; Schmitz, Guido

doi:10.1017/s1431927621000180

Cited by 11 publications

(5 citation statements)

References 53 publications

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“…The FE process of second-phase particles has been widely studied with atomic modeling [8,10,13,64,65], for almost 20 years now [7]. APT reconstruction particles are known in the literature to be strongly biased by artifacts named local magnification effects and trajectory overlaps [8,66,67].…”

Section: Nanoparticlesmentioning

confidence: 99%

Mesoscopic modeling of field evaporation on atom probe tomography

Hatzoglou

Klaes

Delaroche

et al. 2023

J. Phys. D: Appl. Phys.

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Reconstructions in Atom Probe Tomography (APT) are biased by image distortions arising from dynamic changes of the specimen geometry that controls image projection. Despite the strong efforts to build realistic models for understanding and reproducing image artefacts, current models are too slow or not adapted to be routinely used in image correction approaches. To understand the APT imaging process for real size samples submitted to realistic experimental conditions of electric field and temperature, we propose an alternative simulation tool based on a coarse-grained model of the sample surface. The surface electric field on a meshed surface is calculated by using continuous models describing field evaporation. The dynamic evolution of the sample surface and the image projection are predicted using materials properties. We show that the interplay between temperature and electric field is an important ingredient in predicting the ion projection, in pure metals and in more complex materials. This fast approach accurately reproduces the well-known local magnification and trajectory overlaps effects in the evaporation of small particles. By combining prior knowledge about the sample structure and properties, the model could be used to improve the reconstruction approaches for complex sample geometries.

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Section: Nanoparticlesmentioning

confidence: 99%

Mesoscopic modeling of field evaporation on atom probe tomography

Hatzoglou

Klaes

Delaroche

et al. 2023

J. Phys. D: Appl. Phys.

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“…The particle morphological variation observed by Shah et al [63] on the same alloy confirms this hypothesis. This well-known APT artefact strongly modifies the apparent reconstructed particle morphology [64,65]. For each particle in the aged condition, a BFE was estimated to extract the principal dimensions of a particle (L 3 , L 2 and L 1 where L 3 L 2 L 1 ) [57].…”

Section: Atom Probe Tomographymentioning

confidence: 99%

The Evolution of Precipitates in an Al-Zn-Mg Alloy

Thronsen

Shah

Hatzoglou

et al. 2023

Preprint

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“…The representation of the data can be adjusted by manipulating the data stream using element and geometry filters. Data evaluation currently includes isosurfaces and orthoslices, composition profiles, cluster search algorithms (Lawitzki et al, 2021), nearest-neighbor analyses, and SDMs (Geiser et al, 2007). The aim is to further expand the number of possible evaluation modules.…”

Section: Cryo-samplesmentioning

confidence: 99%

A Modular Atom Probe Concept: Design, Operational Aspects, and Performance of an Integrated APT-FIB/SEM Solution

Stender

Solodenko

Weigel³

et al. 2022

Microscopy and Microanalysis

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Atomic probe tomography (APT) is able to generate three-dimensional chemical maps in atomic resolution. The required instruments for APT have evolved over the last 20 years from an experimental to an established method of materials analysis. Here, we describe the realization of a new modular instrument concept that allows the direct attachment of APT to a dual-beam SEM microscope with the main achievement of fast and direct sample transfer and high flexibility in chamber and component configuration. New operational modes are enabled regarding sample geometry, alignment of tips, and the microelectrode. The instrument is optimized to handle cryo-samples at all stages of preparation and storage. It comes with its own software for evaluation and reconstruction. The performance in terms of mass resolution, aperture angle, and detection efficiency is demonstrated with a few application examples.

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Compensating Local Magnifications in Atom Probe Tomography for Accurate Analysis of Nano-Sized Precipitates

Abstract: Abstract

Cited by 11 publications

References 53 publications

Mesoscopic modeling of field evaporation on atom probe tomography

Mesoscopic modeling of field evaporation on atom probe tomography

The Evolution of Precipitates in an Al-Zn-Mg Alloy

A Modular Atom Probe Concept: Design, Operational Aspects, and Performance of an Integrated APT-FIB/SEM Solution

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