Compatibility Check of the Prior Information on Low Voltage Switchgear

Abstract

Generally, the test data of the low voltage switchgear are very few. In order to assess the reliability more accurately, historical data are used to maximum the capacity of the test data. The premise of using the prior information is the prior data and test data should approximately come from the same overall. This is just the problem of compatibility check. In this paper, the method of fitting data and the law of testing the distribution are used to analyze both the priori and test data. Furthermore, we present a novel method of using Wilcoxon rank sum test to check the compatibility of the prior and test data of the low voltage switchgear. Both methods lead to the conclusion that the prior and the test data of the low voltage switchgear are compatible.

Bayesian Estimation of Residual Life for Weibull-Distributed Components of On-Orbit Satellites Based on Multi-Source Information Fusion

“…The consistency test is necessary after obtaining the prior distributions according to multi-source information, which could guarantee that the prior information and field data are from the same population. Typical methods, e.g., the graph comparison method [44], are not applicable here, as failure times are not sufficient. Hence, the Bayes credible interval method is used here.…”