Comparison Study of Time Domain Reflectometry (TDR) Measurement Methods for Detecting Wire Interconnect Related Open-Contact and Short-Contact Failures in Power Semiconductor
Abstract:Open-contact and short-contact are 2 common failures that causing power semiconductor to have electrical malfunctioned. One of the reasons of these failures relate to defective in the wire interconnect. Time domain reflectometry (TDR) is a common method widely used to detect failures in semiconductor devices. This study focused on comparing 3 different TDR measurement methods in detecting wire related open and short failure for power semiconductor, namely Single-Ended method, Single-Pin Grounded method and All… Show more
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