Comparison of the Fourier transform and flip-flop thin-film synthesis methods

Estimation of the average residual reflectance of broadband antireflection coatings

“…For two-component designs we should consider the ratio of high and low refractive indices, the ratio of substrate and ambient medium refractive indices, and the ratio of low refractive index and ambient medium refractive index. For all the coatings, in particular for AR coatings, the design total optical thickness is an extremely important design parameter [15,16]. The computational experiments of many authors [3,17,18] show that the average residual reflectance depends strongly on the width of the AR spectral region.…”

A Technologically Acceptable Coating Synthesis Based on the Flip-flop Synthesis Method

“…(2) Split the system into a great number of layers of equal geometrical thickness and define the initial value of the refractive index in each layer (n L or nH) . This method converges very quickly and, for almost any initial configuration of refractive indices, we obtain a coating with good performance (for details see [5]). dL =dQ (nQ-n 2 )/(n 2 -n2) Technologically acceptable coating synthesis 1 1 3 However, in cases where the character of the problem requires more than two refractive indices (for example the anti-reflection problem), the resulting systems are usually unpleasant, from a technological point of view, because of the appearance of very thin layers even after integration .…”

Optimization of the genetic operators and algorithm parameters for the design of a multilayer anti-reflection coating using the genetic algorithm

“…Among them, refinement methods [13] and synthesis methods [14] are two numerical methods commonly used for optical thin-film designs. The refinement method requires a starting design, from which the target design is obtained by gradually modifying the starting design.…”