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2009 18th IEEE International Symposium on the Applications of Ferroelectrics 2009
DOI: 10.1109/isaf.2009.5307571
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Comparison of scanning evanescent microwave microscopy with co-planar waveguide methods of characterization of Ba<inf>0.5</inf>Sr<inf>0.5</inf>TiO<inf>3</inf> thin films

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Cited by 3 publications
(6 citation statements)
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“…Most of the papers published in the near-field microwave microscopy present qualitative characterizations [7][8][9][10], where no complex permittivity values are given. Some other publications on the near-field microscopy present the quantitative measurement of complex permittivity of dielectric samples [11][12][13]. The difference in the complex permittivity values presented in that paper and those referenced by other measurement techniques is quite high (15% in average).…”
Section: Introductionmentioning
confidence: 93%
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“…Most of the papers published in the near-field microwave microscopy present qualitative characterizations [7][8][9][10], where no complex permittivity values are given. Some other publications on the near-field microscopy present the quantitative measurement of complex permittivity of dielectric samples [11][12][13]. The difference in the complex permittivity values presented in that paper and those referenced by other measurement techniques is quite high (15% in average).…”
Section: Introductionmentioning
confidence: 93%
“…This surface is determined by measuring the lateral electric field radiation from the tip used in the measurements. A second paper published by Barker et al [12] on the quantitative characterization of dielectric samples with the technique of near-field microscopy also had a measurement uncertainty of over 25% on the values of relative permittivity and loss tangent. Thus the shape of the sample outside the area 25 mm 2 does not change the response of our probe because it is not seen by the electric field of the tip.…”
Section: V C H a R A C T E R I Z A T I O N O F M A T E R I A L Smentioning
confidence: 99%
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“…The structure of an open‐ended coaxial cavity resonator is frequently utilized in moisture sensors, permittivity sensors, and an electron microscope used for analyzing dielectric characteristics. However, the process of designing such a resonator has been complicated, and in most cases, no sufficient explanation on it has been provided.…”
Section: Introductionmentioning
confidence: 99%