Comparison of phase extraction algorithms in testing of phase defects with two-point interference

Zi-wen, 戚子文 Qi; Bingguo, 刘炳国 Liu; Zhong-hai, 张仲海 Zhang; Bing-hui, 卢丙辉 Lu; Guodong, 刘国栋 Liu

doi:10.3788/co.20160904.0483

中国光学

2016

DOI: 10.3788/co.20160904.0483

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Comparison of phase extraction algorithms in testing of phase defects with two-point interference

戚子文 Qi Zi-wen¹,

刘炳国 Liu Bingguo²,

张仲海 Zhang Zhong-hai³

et al.

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Comparison of phase extraction algorithms in testing of phase defects with two-point interference

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