“…Sensitivity and signal-to-noise ( S/N ) are major challenges in low frequency EPR experiments (Rinard et al, 2011). Rapid-scan EPR at X-band (~ 9.5 GHz) has been shown to yield improved S/N per unit time relative to CW EPR by a factor of 2 for rapidly-tumbling nitroxides in fluid solution (Mitchell et al, 2012), by factors of 6 to 30 for immobilized nitroxides (Yu et al, 2014), by factors of 10 to 40 for spin-trapped superoxide (Mitchell et al, 2013a), by a factor of 8 for the E′ center in irradiated fused quartz (Mitchell et al, 2011), by more than a factor of 250 for amorphous hydrogenated silicon (Mitchell et al, 2013b), by a factor of 25 for N@C 60 diluted in C 60 (Mitchell et al, 2013b), and by more than a factor of 140 for the neutral single substitutional nitrogen centers (N S 0 ) in diamond (Mitchell et al, 2013b). At 250 MHz rapid scan improves S/N relative to CW by about a factor of 10 for EPR imaging (Biller et al, 2015; Biller et al, 2014).…”