Proceedings of the Workshop on Low Temperature Semiconductor Electronics
DOI: 10.1109/ltse.1989.50174
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Comparison of carrier velocity in 0.25 mu m gate-length conventional, pseudomorphic, and lattice-matched modulation-doped FETs at 300 K and 77 K

Abstract: In this paper, we report microwave characterization of 0.25pm gatelength MODFET's at 300 and 77K. We have exploited the microwave S-parameter measurements of MODFET'S from 0.045-20 GHz to extract their HF equivalent network parameters. The details of these measurement technique will be published eisewheref101. By exploiting this technique, we have determined the effective carrier saturation velocity(uuat) and the average velocity ( U a v ) at 300 and 77K for these submicron gate-length devices. Utilizing the t… Show more

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