2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/R 2016
DOI: 10.1109/nssmic.2016.8069551
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Comparison of a large area CZT detector to a spectroscopic CdTe detector for X-ray fluorescence computed tomography

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“…Hence, high atomic number atoms/nanoparticles are used in XF imaging with emission energies between 6 and 100 keV. A major challenge in XF imaging is scattered radiation from the primary excitation beam . The main method of scatter signal reduction is the deployment of energy resolving detectors which can distinguish fluorescent x rays from radiation of other origin.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Hence, high atomic number atoms/nanoparticles are used in XF imaging with emission energies between 6 and 100 keV. A major challenge in XF imaging is scattered radiation from the primary excitation beam . The main method of scatter signal reduction is the deployment of energy resolving detectors which can distinguish fluorescent x rays from radiation of other origin.…”
Section: Introductionmentioning
confidence: 99%
“…A major challenge in XF imaging is scattered radiation from the primary excitation beam. 4,5,8 The main method of scatter signal reduction is the deployment of energy resolving detectors which can distinguish fluorescent x rays from radiation of other origin. As such detectors are expensive and specifically designed for different energy ranges, count rates, and active detection areas, experiments and detectors must be carefully designed to fully exploit the potential of XFCT imaging.…”
Section: Introductionmentioning
confidence: 99%