Comparison between two optimisation algorithms to compute the complex permittivity of dielectric multilayer structures using a free-space quasi-optical method in W-band

Elhawil, Amna; Koers, Gaetan; Zhang, Lixiao; Stiens, Johan; Vounckx, Roger

doi:10.1049/iet-smt:20070085

Cited by 21 publications

(14 citation statements)

References 14 publications

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“…Numerical methods, such as Newton-Raphson (N-R), Genetic Algorithm (GA), and Root Finding Algorithm (RFA), are used as well beside of this analytical method. Artificial neural networks (ANN) algorithms, which can be learned by analysis of obtained data from calculation, are also used in estimating the complex permittivity [45][46][47].…”

Section: Extraction Techniquesmentioning

confidence: 99%

“…Basically, the complex permittivity and permeability of the materials are extracted by reflection (S 21 ) and/or transmission (S 11 ) parameters, which are called as scattering parameters [48]. In these processes, many techniques such as Nicholson-Ross-Weir (NRW), NIST, Root Find Algorithm (RFA), and Genetic Algorithm (GA) are used [45,49]. The techniques used in the extraction process can be divided into two main categories as analytical and numerical.…”

Section: Analytical and Numerical Extraction Techniquesmentioning

confidence: 99%

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Measurement Methods and Extraction Techniques to Obtain the Dielectric Properties of Materials

Öztürk¹,

Guneser²

2019

Electrical and Electronic Properties of Materials

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Material characterization plays an important role in many applications that are called as security, military, communication, bioengineering, medical treatment, food industry, and material processing, since it is useful to identify other properties such as stress-strain relation, bio content, moisture content, materials density, etc. Therefore, the dielectric properties of materials should be achieved with high accuracy using appropriate measurement techniques and extraction techniques. There are many measurement methods to obtain the dielectric properties of materials, which can be divided into two categories: up conversion and down conversion methods. A microwave measurement method can be called as frequency up conversion, while THz time-domain spectroscopy (THz-TDS) system is a frequency down conversion method. The selection of more convenient measurement method depends on some parameters such as frequency range, material phase, and temperature. In this chapter, the measurement methods and extraction techniques will be discussed, and alternative ways will be presented with experimental and simulation results.

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Section: Extraction Techniquesmentioning

confidence: 99%

Section: Analytical and Numerical Extraction Techniquesmentioning

confidence: 99%

Measurement Methods and Extraction Techniques to Obtain the Dielectric Properties of Materials

Öztürk¹,

Guneser²

2019

Electrical and Electronic Properties of Materials

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“…Based on this assumption, we can simplify the calculation process, only Re(e 1 ) and r need to be calculated and the resistivity is the inverse of the conductivity (q ¼ 1/r). We use the genetic algorithm (GA) [17][18][19] to compute the values that give the best fit for the reflection coefficient.…”

Section: Theorymentioning

confidence: 99%

“…By using the continuous variable concept, the continuous QKD can be formed and available for a large demand. There are some works proposed the use of continuous variable QKD with quantum router and network [17,18]. However, the requirement of large bandwidth signal and dense wavelength multiplexing become the practical problems.…”

Section: Introductionmentioning

confidence: 99%

Contactless monitoring of Si substrate permittivity and resistivity from microwave to millimeter wave frequencies

Elhawil

Neve

Olbrechts

et al. 2010

Micro & Optical Tech Letters

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“…Thirdly, optimization algorithms such as genetic algorithm and sequential quadratic programming are applied to S-parameter measurements to compute the permittivity of dielectric multi-layer structures in free-space. Both techniques are partly slow, but with reasonable accuracy [11]. Tomographic imaging is based on computed tomography (CT), which uses the pulse or the CW systems [12,13].…”

Section: Introductionmentioning

confidence: 99%

Error Assessment and Mitigation Methods in Transient Radar Method

Pourkazemi

Tayebi

Stiens

2020

Sensors

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Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around λ / 5 .

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Comparison between two optimisation algorithms to compute the complex permittivity of dielectric multilayer structures using a free-space quasi-optical method in W-band

Cited by 21 publications

References 14 publications

Measurement Methods and Extraction Techniques to Obtain the Dielectric Properties of Materials

Measurement Methods and Extraction Techniques to Obtain the Dielectric Properties of Materials

Contactless monitoring of Si substrate permittivity and resistivity from microwave to millimeter wave frequencies

Error Assessment and Mitigation Methods in Transient Radar Method

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