2010 IEEE International Symposium on Electrical Insulation 2010
DOI: 10.1109/elinsl.2010.5549833
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Comparing simulation results and experimental measurements of electroluminescence phenomenon in dielectric materials

Abstract: Under continuous application of high electrical stresses, the insulation system of an underground power cable is subjected to long-term degradation that can eventually cause premature breakdown of the cable. This is as a result of electronic charges being injected into the dielectric material when intense electric field is applied. These charges will then interact with polymer molecules; causing even more charges to accumulate within the vicinity of the material and thus further deterioration. The interaction … Show more

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Cited by 4 publications
(4 citation statements)
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“…The model is able to reproduce the experimental data, especially in terms of the phase angle between EL and the applied voltage as well as the shape of the EL distribution within each half cycle of the applied voltage. More recently, Ariffin et al [11] have developed a model based on the same concepts but considering a smaller penetration depth (order of 10 nm) of the injected charges into the dielectric. Phase angle between EL and applied stress is correctly described.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The model is able to reproduce the experimental data, especially in terms of the phase angle between EL and the applied voltage as well as the shape of the EL distribution within each half cycle of the applied voltage. More recently, Ariffin et al [11] have developed a model based on the same concepts but considering a smaller penetration depth (order of 10 nm) of the injected charges into the dielectric. Phase angle between EL and applied stress is correctly described.…”
Section: Introductionmentioning
confidence: 99%
“…Supposing that EL emission pattern reflects the field at the injecting electrode, for explaining the phase advance of EL in respect to applied field (typically 30-40°for uniform field configuration), the amount of stored charge must be such that the space charge-induced field represents 20% of the applied crest field. In previous models, the order of magnitude of the space charge density allowing field mediation at the injecting electrode in a uniform field configuration is typically 0.1 C.m -3 when considering a 100 µm space charge layer [9]; it is of 10 +4 C.m -3 when considering a carrier penetration depth of 10 nm as in [11] with quite different applied field amplitude. Having said so, the question that is raised is the physical soundness of these models.…”
Section: Introductionmentioning
confidence: 99%
“…Only a brief description is given here, more details of this model are given in [1]. Transport, diffusion and extraction of charge at the electrodes are not accounted for.…”
Section: B Model Imentioning
confidence: 99%
“…Recently, an electroluminescence model has been developed at Southampton [1] by examining the changes to the electric field at the injecting electrode due to the presence of the injected charge carriers. This model is based on current injection and recombination processes in a dielectric material.…”
Section: Introductionmentioning
confidence: 99%