2020
DOI: 10.1016/j.nima.2019.162992
|View full text |Cite
|
Sign up to set email alerts
|

Comparing image quality in phase contrast subμ X-ray tomography—A round-robin study

Abstract: How to evaluate and compare image quality from different sub-micrometer (subµ) CT scans? A simple yet clever test phantom is used for recording 13 scans in a number of commercial and some non-commercial scanners. From the resulting volume images, signal and noise power spectra are modeled for estimating spatial signalto-noise ratio (SNR spectrum). Using the same data, a time-and object-independent transfer function (MTF) is computed for each scan, including phase contrast strength and spatial resolution (MTF b… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2020
2020
2022
2022

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 10 publications
(3 citation statements)
references
References 20 publications
(24 reference statements)
0
3
0
Order By: Relevance
“…In‐line, or propagation‐based phase‐contrast X‐ray imaging (PBI) is especially promising for high‐resolution micro‐ and nano‐CT investigations of low‐density and low‐attenuation samples. It is finding more and more widespread applications due to the increased availability of CT scanners with micro‐ and nano‐focus laboratory X‐ray sources 8,9 . This makes the technique much more accessible to researchers outside of the synchrotron realm.…”
Section: Introductionmentioning
confidence: 99%
“…In‐line, or propagation‐based phase‐contrast X‐ray imaging (PBI) is especially promising for high‐resolution micro‐ and nano‐CT investigations of low‐density and low‐attenuation samples. It is finding more and more widespread applications due to the increased availability of CT scanners with micro‐ and nano‐focus laboratory X‐ray sources 8,9 . This makes the technique much more accessible to researchers outside of the synchrotron realm.…”
Section: Introductionmentioning
confidence: 99%
“…The time needed to perform a single measurements is considerable, which further complicates matters. The exposure times necessary at such resolutions often reach 30 seconds per projection, leading to scan times of more than 10 hours for one dataset [10].…”
Section: Introductionmentioning
confidence: 99%
“…This source has been integrated into our follow-up in-house nano tomography system ntCT [17], which is further equipped with high precision positioning stages for tomography applications and a photon counting detector for the efficient detection of X-rays. First benchmarks of the system have recently been given in [18,19].…”
Section: Introductionmentioning
confidence: 99%