“…ZnO structure is of the same, wurtzite type, both in nanowires and thin lms. 21,22 Atomic force microscopy (AFM), as one of the most popular scanning probe microscopy methods, enables imaging topography of almost any type of surface, such as polymers, ceramics, and composites. The substrate surface greatly affects the analysis of the sample, therefore, deposition on a very rough substrate disables the straightforward small particle size analysis.…”