2016
DOI: 10.20309/jdis.201611
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Comparative Study of Trace Metrics between Bibliometrics and Patentometrics

Abstract: Purpose: To comprehensively evaluate the overall performance of a group or an individual in both bibliometrics and patentometrics.Design/methodology/approach: Trace metrics were applied to the top 30 universities in the 2014 Academic Ranking of World Universities (ARWU) -computer sciences, the top 30 ESI highly cited papers in the computer sciences field in 2014, as well as the top 30 assignees and the top 30 most cited patents in the National Bureau of Economic Research (NBER) computer hardware and software c… Show more

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Cited by 2 publications
(1 citation statement)
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References 14 publications
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“…S. Chen, Shih, & Chang, 2014;E. J. Han & Sohn, 2015;Hegde & Sampat, 2009;Kousha & Thelwall, 2017;Meyer, 2000aMeyer, , 2000bSarin et al, 2020;Tseng, Lin, & Lin, 2007;Venugopalan & Rai, 2015;Wang, Lei, & Lee, 2014;Ye, Huang, & Chen, 2016) sobre documentos de patente se limitaban al análisis de los datos bibliográficos (inventores, años, empresas, palabras clave, …), por ello, hasta la presente tesis, el estudio de los enlaces contenidos en patentes es muy limitado (Orduña-Malea, Thelwall, & Kousha, 2016).…”
Section: Retos En La Mediciónunclassified
“…S. Chen, Shih, & Chang, 2014;E. J. Han & Sohn, 2015;Hegde & Sampat, 2009;Kousha & Thelwall, 2017;Meyer, 2000aMeyer, , 2000bSarin et al, 2020;Tseng, Lin, & Lin, 2007;Venugopalan & Rai, 2015;Wang, Lei, & Lee, 2014;Ye, Huang, & Chen, 2016) sobre documentos de patente se limitaban al análisis de los datos bibliográficos (inventores, años, empresas, palabras clave, …), por ello, hasta la presente tesis, el estudio de los enlaces contenidos en patentes es muy limitado (Orduña-Malea, Thelwall, & Kousha, 2016).…”
Section: Retos En La Mediciónunclassified