Comparative Study of Thickness Dependence of Critical Current Density of Yba₂Cu₃O_7–δ on (100) SrTiO₃ and on Rolling-assisted Biaxially Textured Substrates

Abstract

We investigated the dependence of critical current density (Jc) on thickness of Yba2Cu3O7−δ (YBCO) films grown by pulsed laser deposition on (100) SrTiO3 (STO) and on rolling-assisted biaxially textured substrates (RABiTS). The thickness of YBCO films varied from 0.19 to 3 μm. The highest Jcs of 5.3 and 2.6 MA/cm2 at 77 K, self-field were obtained for 0.19-μm YBCO films on STO and RABiTS, respectively. Jc was found to decrease exponentially with YBCO thickness on both substrates. However, the results suggest different mechanisms are responsible for the Jc reduction in the two cases. On STO, growth of a-axis grains within c-axis films and broadening of the in-plane texture were observed in thick films. On RABiTS, degradation in cube texture as well as development of a porous surface morphology were found to correlate with film thickness.

Effect of the In-Plane Epitaxial Mismatch between the Substrate and the Film on the Properties of YBa2Cu3O7-δFilms

“…A similar behavior has been observed previously in YBCO films [7,8]. The J c is a linear function of temperatures at low T , as typically observed for YBCO thin films, and changes to nonlinear at higher T .…”

“…In such a case the film thickness plays the role of parameter regulating strain distribution in films. The studies of the YBa 2 Cu 3 O 7−δ (YBCO) films on commonly used substrates, LaAlO 3 (LAO), LaSrAlO 4 (LSAO), (549) and SrTiO 3 (STO) [5][6][7][8], indicate that the crystalline structure and the superconducting properties of YBCO are highly sensitive to the film thickness. The purpose of the present study is to evaluate the structural and superconducting properties of the films of different thicknesses ablated on the new type of substrate, (SrAl 0.5 Ta 0.5 O 3 ) 0.7 (CaAl 0.5 Ta 0.5 O 3 ) 0.1 (LaAlO 3 ) 0.2 (SAT-CAT-LA), with the in-plane lattice parameter a = 3.8741Å.…”

Influence of CeO2-Cap Layer on the Texture and Critical Current Density of YBCO Film

“…PLD technique has been regarded as one of the most promising methods because of precise control of films reproducibility, uniformity and simplicity, so it has been widely used in preparing thin films. Since the growth condition of YBCO thin films was sensitive to the deposition temperature, effect of deposition temperature and thickness on the growth of epitaxial YBCO films with c-axis orientation has been extensively studied by various methods [3][4][5]. From the results of previous studies [6][7][8], the optimal temperature range of YBCO film growth was concerned and the thickness of YBCO films largely affected the critical current density.…”

Thickness dependence of critical current density in GdBa2Cu3O7−δ thin films with BaSnO3 addition

“…11 In order to check a-axis growth, the surface morphology of GdBCO films was examined by the SEM measurement as shown in Fig. 2.…”