Comparative Study of Single-Event Effect Tolerance Between Planar and Trench SiC Power MOSFETs

Fang, XingYu; Shu, Lei; Li, TongDe; Wang, Liang; Li, XinYu; Wang, LiHao

doi:10.1109/icreed59404.2023.10390900

2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED) 2023

DOI: 10.1109/icreed59404.2023.10390900

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Comparative Study of Single-Event Effect Tolerance Between Planar and Trench SiC Power MOSFETs

XingYu Fang,

Lei Shu,

TongDe Li

et al.

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Comparative Study of Single-Event Effect Tolerance Between Planar and Trench SiC Power MOSFETs

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References 10 publications

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