AIP Conference Proceedings
 2010
DOI: 10.1063/1.3482694
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Comparative Study of Plasma-Sprayed Yttria-Stabilized Zirconia Thin Films Based on Conventional and Nanostructured Powder

Britt‐Elfriede Schuster1,
Claudia Christenn2,
Andrea Haug3
et al.

Abstract: Effect of deposition interruption and substrate bias on the structure of sputter-deposited yttria-stabilized zirconia thin films

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