2002
DOI: 10.1109/tim.2002.802238
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Comparative characteristics of thick-film integrated LC filters

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Cited by 13 publications
(4 citation statements)
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“…During the last several years our research activities have been under way to develop and simulate integrated passive components that are part of the thick film circuit and are fabricated with the same production techniques as hybrid circuits. This paper, based upon many experimental published works Živanov et al (1998); Živanov et al (1999); Živanov et al (2000); Desnica et al (1999); Desnica et al (2000 b ); Desnica et al (2000 a ); Desnica et al (2001 c ); Desnica et al (2001 a ); Desnica et al (2001 b ); Desnica et al (2002 a ); Desnica et al (2002 b ) where we have researched the planar inductive structures such as different kinds of spiral, meander and solenoid‐bar type, gives a new concept for the EMI thick film passive component.…”
Section: Introductionmentioning
confidence: 91%
“…During the last several years our research activities have been under way to develop and simulate integrated passive components that are part of the thick film circuit and are fabricated with the same production techniques as hybrid circuits. This paper, based upon many experimental published works Živanov et al (1998); Živanov et al (1999); Živanov et al (2000); Desnica et al (1999); Desnica et al (2000 b ); Desnica et al (2000 a ); Desnica et al (2001 c ); Desnica et al (2001 a ); Desnica et al (2001 b ); Desnica et al (2002 a ); Desnica et al (2002 b ) where we have researched the planar inductive structures such as different kinds of spiral, meander and solenoid‐bar type, gives a new concept for the EMI thick film passive component.…”
Section: Introductionmentioning
confidence: 91%
“…EMI filter insertion losses are handled at 50Ω input and output impedance [ 11 - 12 ]. Normally, such impedance does not exist in real electronic circuits.…”
Section: Adjustments and Filteringmentioning
confidence: 99%
“…This simplifies the technological process, e.g. in MEMS (Dahlmann and Yeatman, 2000; Dahlmann et al , 2002) and in thick film integrated LC filters (Desnica et al , 2002). Also, for the estimation of near‐surface material properties (e.g.…”
Section: Introductionmentioning
confidence: 99%