Comparative analysis of resolution measurement methods for the optoelectronic systems

Abstract

Machine vision systems are a dynamically developing field of robotics. They give the ability to detect, visualize, track and recognize objects to the manufacturing and controlling cyberphysical systems. The use of such systems along with modern image processing algorithms allows shifting part of the operator's routine duties to a robotic system, in accordance with the industry 4.0 paradigm. An important property of the machine vision system is the resolving power, which can be estimated using various parameters and characteristics. The goal of this paper is to compare existing resolution measurement methods for the machine vision systems and to discuss their advantages and drawbacks.