2019
DOI: 10.1088/1742-6596/1153/1/012070
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Comparation of X-ray diffraction pattern refinement using Rietica and MAUD of ZnO nanoparticles and nanorods

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Cited by 7 publications
(5 citation statements)
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“…Therefore, discussing the cell parameters through other simple method by powder X-ray diffraction may be relevant. Quite recently, the cell parameters of some complexes have been estimated from the corresponding powder-XRD by applying Le Bail method [9][10][11][12][13][14] , which is usually applied for powder metal oxides [15][16][17][18] . While in the absence of single crystal due to unsuccessful on producing them are quite often, the powder XRD offers an alternative way to estimate the cell parameters, and probably the position of atoms and thus bond lengths as well as bond angles might be depicted in one occation.…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, discussing the cell parameters through other simple method by powder X-ray diffraction may be relevant. Quite recently, the cell parameters of some complexes have been estimated from the corresponding powder-XRD by applying Le Bail method [9][10][11][12][13][14] , which is usually applied for powder metal oxides [15][16][17][18] . While in the absence of single crystal due to unsuccessful on producing them are quite often, the powder XRD offers an alternative way to estimate the cell parameters, and probably the position of atoms and thus bond lengths as well as bond angles might be depicted in one occation.…”
Section: Introductionmentioning
confidence: 99%
“…Sigma and R exp quality factors obtained for the Rietveld analysis XRD are 1.4 and 2.7, respectively, for the US-RN nanoparticles while they are 1.4 and 3.2 for the OM 6231A powder. These values indicate highly reliable results for the quantification of crystallographic phases in the analyzed powders since they are below 2 for sigma and below 15 for R exp (Ref 34,35).…”
Section: Feedstock Powdersmentioning
confidence: 80%
“…The above indicates that the values reported in Table 3 are reliable, since the criteria established for the goodness of fitting for Rietveld refinements performed with MAUD are sig. < 2 and R exp < 15 (Ref 34,35). The high values of standard deviation calculated for some of the phases can be attributed to their low crystallinity.…”
Section: Manufactured Coatingsmentioning
confidence: 98%
“…For both samples, the 2 Ɵ° diffraction peaks of 31.80, 34.41, 36.21, 47.52 and 56.53 correspond well to the reticular planes (100), ( 002), ( 101), ( 102) and ( 110) respectively, of the hexagonal wurtzite structure of ZnO (JCPDS no. 36-1451 ZnO wurtzite structure) [18,19]. The diffraction peaks at 38.1 and 44.…”
Section: X-ray Diffractionmentioning
confidence: 99%