Microelectronics Reliability
 2018
DOI: 10.1016/j.microrel.2017.12.003
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Compact modeling of dynamic trap density evolution for predicting circuit-performance aging

Mitiko Miura-Mattausch
1
,
H. Miyamoto
2
,
Hideyuki Kikuchihara
3
et al.
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Cited by 8 publications
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References 40 publications
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Modeling of Carrier Trapping and Its Impact on Switching Performance

Miura-Mattausch
1
,
Kikuchihara
2
,
Maiti
3
et al. 2018
2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
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Modeling of Carrier Trapping and Its Impact on Switching Performance

Miura-Mattausch
1
,
Kikuchihara
2
,
Maiti
3
et al. 2018
2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)
1
0
0
0
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Compact Modeling for Power Efficient Circuit Design

Miura-Mattausch
1
,
Kikuchihara
2
,
Kajiwara
3
et al. 2018
2018 48th European Solid-State Device Research Conference (ESSDERC)
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NVDL-Cache: Narrow-Width Value Aware Variable Delay Low-Power Data Cache

Rohbani
1
,
Maiti
2
,
Navarro
3
et al. 2019
2019 IEEE 37th International Conference on Computer Design (ICCD)
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