2023
DOI: 10.1109/tpel.2022.3198835
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Compact-Interleaved Packaging Method of Power Module With Dynamic Characterization of 4H-SiC MOSFET and Development of Power Electronic Converter at Extremely High Junction Temperature

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Cited by 13 publications
(5 citation statements)
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“…Although WBG devices have many advantages over Si devices, the drift region of the WBG power device is usually narrower than that of the corresponding Si device with the same rated power, which allows WBG devices to possess smaller junction capacitance, gate resistance, and switching time constant [102] . However, during switching transients under high dv/dt, high di/dt, and high operating frequency conditions, the parasitic inductance of WBG devices tends to trigger voltage and current overshoots, high-frequency ringing noise, and electromagnetic interference (EMI) problems, which have a significant impact on reliably generating high-precision and high-resolution high-frequency ultrasonic signals [103] . The technologies solving the above problems mainly include active gate drive technology, modulation technology, damping technology, passive technology [91] , [104] , etc.…”
Section: Core Devices In Circuit Designmentioning
confidence: 99%
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“…Although WBG devices have many advantages over Si devices, the drift region of the WBG power device is usually narrower than that of the corresponding Si device with the same rated power, which allows WBG devices to possess smaller junction capacitance, gate resistance, and switching time constant [102] . However, during switching transients under high dv/dt, high di/dt, and high operating frequency conditions, the parasitic inductance of WBG devices tends to trigger voltage and current overshoots, high-frequency ringing noise, and electromagnetic interference (EMI) problems, which have a significant impact on reliably generating high-precision and high-resolution high-frequency ultrasonic signals [103] . The technologies solving the above problems mainly include active gate drive technology, modulation technology, damping technology, passive technology [91] , [104] , etc.…”
Section: Core Devices In Circuit Designmentioning
confidence: 99%
“…(b) High-frequency CCL of SiC device in double pulse test circuit (indicated by the red line). (c) Switching waveforms of switching transients of SiC MOSFET considering parasitic parameter [103] . …”
Section: Core Devices In Circuit Designmentioning
confidence: 99%
“…where π‘š 𝑖 represents the modulation index of the inverter controlled by the SPWVM. It has a maximum value of 1 and it can be calculated by (12). In (12), 𝑉 𝐿𝑖𝑛𝑒 and 𝑉 𝐷𝐢 represent the peak value of the line-to-line voltage and the dc-link voltage, respectively.…”
Section: Analysis Of Voltage Ripplementioning
confidence: 99%
“…It has a maximum value of 1 and it can be calculated by (12). In (12), 𝑉 𝐿𝑖𝑛𝑒 and 𝑉 𝐷𝐢 represent the peak value of the line-to-line voltage and the dc-link voltage, respectively.…”
Section: Analysis Of Voltage Ripplementioning
confidence: 99%
See 1 more Smart Citation