Compact fault dictionary construction for efficient isolation of faults in analog and mixed-signal circuits

Chakrabarti, S.; Chatterjee, Abhijit

doi:10.1109/arvlsi.1999.756057

Cited by 14 publications

(7 citation statements)

References 20 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The former defines the circuit parameters' maximal deviation from the nominal value and the latter specifies the maximum deviation of the relation between correlated circuit parameters' values. The absolute tolerance specifies the influence of manufacturing process' fluctuations on the whole chip, while the coupling tolerance defines effects of fabrication process local wavering [1,2,32,33].…”

Section: Gpf Model Of Integrated Circuitmentioning

confidence: 99%

“…There is a need of a GPF model for the purpose of the analysis of a GPF influence on the tested circuit [1,2,34]. This model has been created with a several assumptions based on the AIC fabrication process character.…”

Section: Terms and Definitionsmentioning

confidence: 99%

“…-The character of faults in AIC is different from discrete analogue circuits which results from the manufacturing process. A new kind of faults -multiple and proportional parametric faults (global parametric faults) -is one of the most important issues that needs to be investigated in AIC diagnosis [1,3,5].…”

Section: Introductionmentioning

confidence: 99%

“…-AIC are relatively small (single millimeters) thus the number of and the access to test pads is limited [1][2][3][4]. -The character of faults in AIC is different from discrete analogue circuits which results from the manufacturing process.…”

Section: Introductionmentioning

confidence: 99%

“…-The fault influence is propagated toward both input and output of the circuit. -Analogue signals are complex and continuous [1][2][3][4][5][6][7][8][9][10][11][12][13][14] in their nature.…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

Evolutionary algorithms for global parametric fault diagnosis in analogue integrated circuits

Jantos¹,

Grzechca²,

Rutkowski³

2012

Bulletin of the Polish Academy of Sciences: Technical Sciences

View full text Add to dashboard Cite

Abstract. An evolutionary method for analogue integrated circuits diagnosis is presented in this paper. The method allows for global parametric faults localization at the prototype stage of life of an analogue integrated circuit. The presented method is based on the circuit under test response base and the advanced features classification. A classifier is built with the use of evolutionary algorithms, such as differential evolution and gene expression programming. As the proposed diagnosis method might be applied at the production phase there is a method for shortening the diagnosis time suggested. An evolutionary approach has been verified with the use of several exemplary circuits -an oscillator, a band-pass filter and two operational amplifiers. A comparison of the presented algorithm and two classical methods -the linear classifier and the nearest neighborhood method -proves that the heuristic approach allows for acquiring significantly better results.

show abstract

Section: Gpf Model Of Integrated Circuitmentioning

confidence: 99%

Section: Terms and Definitionsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%