Common-Centroid Layout for Active and Passive Devices: A Review and the Road Ahead

Matching Critical Analog Circuit Components up to 3rd Order Gradients for All Possible Exact Matching Ratios

“…Considering this analysis also holds for column wise operations, averaging over all rows and columns for sums involving i + j = k = odd such as in ( 7), (8), and ( 9), the matching criteria is further reduced to (14).…”

“…Dispersion -the degree to which device segments are spread in a layout -is a metric that has been applied to characterize various patterns [13], [14], [23], [25], however, its application in literature has been used to characterize patterns with 1 : 1…”

“…However, direct observations from wafer mapping [18], [24], reveal the importance of radial process gradients therefore layout should at least cancel up to second order gradient effects. Additionally, [13], [14] (b) Second order central symmetrical pattern [16] (c) Hexagonal tessellation [17] (d) 2nd order circular symmetry pattern [17] 0000-0000/00$00.00 © 2021 IEEE these approaches require using an equal number of unit cells between matched devices while some [16] place an added constraint that equal unit cells must be a multiple of 2 k . However, not all applications require using an equal number of unit cells.…”

“…Example Layouts patterns in literature. (a) Common centroid[13],[14] (b) Second order central symmetrical pattern[16] (c) Hexagonal tessellation[17] (d) 2nd order circular symmetry pattern[17]…”