2011
DOI: 10.1063/1.3605954
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Commissioning of Angle Dispersive X-ray Diffraction Beamline on Indus-2

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Cited by 29 publications
(10 citation statements)
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“…The samples were flipped and re-melted 5 times to ensure homogeneity. The samples were characterized by X-Ray diffraction (XRD) measurements performed using = 0.83019 Å radiation from the BL12 beamline of the Indus-2 synchrotron facility [20]. The details of metallography is presented in ref.…”
Section: Methodsmentioning
confidence: 99%
“…The samples were flipped and re-melted 5 times to ensure homogeneity. The samples were characterized by X-Ray diffraction (XRD) measurements performed using = 0.83019 Å radiation from the BL12 beamline of the Indus-2 synchrotron facility [20]. The details of metallography is presented in ref.…”
Section: Methodsmentioning
confidence: 99%
“…XRD measurements at room temperature, were performed on the powdered single crystals in the BL-12 beam line, using 16 keV x-rays (Sinha et al, 2011). The powdered samples were placed in a circular depression made on Kapton tape.…”
Section: Methodsmentioning
confidence: 99%
“…The NPs, thus synthesized, were analysed by X-ray diffraction (XRD) using angle-dispersive X-ray diffraction (ADXRD) beamline (BL-12) on Indus-2 synchrotron radiation source, India. 18 The beamline is based on a Si (111)-based double-crystal monochromator. The photon beam (0.3 mm × 0.3 mm) of energy ∼11 keV was used.…”
Section: Methodsmentioning
confidence: 99%