Commissioning and performance of the variable line spacing plane grating monochromator beamline at the Canadian Light Source

Abstract

The variable line spacing plane grating monochromator beamline at the Canadian Light Source (CLS) employs three grazing incidence variable line spacing gratings to cover a photon energy range of 5-250 eV. It uses a 185 mm period length planar permanent magnet insertion device as the photon source, sharing a straight section with another soft x-ray beamline at the CLS. The commissioning and performance of the beamline is reported. The high resolution photoabsorption spectra of Ar and PF(5) gases are reported. A resolving power of over 40,000 for photons in the low energy region and >10,000 for a wider energy range (8-200 eV) can be achieved. A photon flux of up to 2 x 10(12) photons/s per 100 mA with slit settings of 50 microm has been measured.

Characterization of boroaluminosilicate glass surface structures by B K-edge NEXAFS

“…NEXAFS measurements were performed at the Variable Line Spacing Plane Grating Monochromator (VLSPGM) beamline at the Canadian Light Source (CLS) [35]. The undulator source supplies the endstation with 5-250 eV photons with resolution better than 0.16 eV over the entire photon range [36].…”

Addition of carboxylic acids modifies phosphate sorption on soil and boehmite surfaces: A solution chemistry and XANES spectroscopy study

“…The VLS-PGM beamline [23][24][25] was used for the measurements at the P and Al L-edges; the SGM beamline [26] was used to acquire scans at the Al K -edge. At both beamlines grating monochromators were employed to select the photon energy.…”

Selective Response of Mesoporous Silicon to Adsorbants with Nitro Groups

“…The XAS measurements were performed in both the bulksensitive total fluorescence yield (TFY) mode, and the surface-sensitive total electron yield (TEY) mode. The Si 2p XAS and C, O 1s XAS measurements were performed at the Spherical Grating Monochromator [82] and Variable Line-spacing Planar Grating Monochromator [83] beamlines at the Canadian Light Source, respectively. All XES measurements were performed at beamline 8.0.1 [84] at the Advanced Light Source.…”