2019
DOI: 10.1016/j.jnoncrysol.2019.119547
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Comments on “How to reveal the correct elemental concentration profiles in poled multicomponent silicate glasses from the data of secondary ion mass spectrometry (SIMS)”

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Cited by 2 publications
(1 citation statement)
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“…Upon this, the composition profile should be corrected, taking the silicon atom as a reference and considering it constant all along the profile. While for Smith et al, 24 this change in intensity is likely originated to a densification of the “silica‐like” layer on the surface, which results in the enhancement of the intensity at the surface. In our work, the comparison between ToF‐SIMS and GD‐OES composition profiles can give some new insights on this important problematic.…”
Section: Resultsmentioning
confidence: 94%
“…Upon this, the composition profile should be corrected, taking the silicon atom as a reference and considering it constant all along the profile. While for Smith et al, 24 this change in intensity is likely originated to a densification of the “silica‐like” layer on the surface, which results in the enhancement of the intensity at the surface. In our work, the comparison between ToF‐SIMS and GD‐OES composition profiles can give some new insights on this important problematic.…”
Section: Resultsmentioning
confidence: 94%