1979
DOI: 10.1016/0022-3093(79)90106-6
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Comments on dielectric properties of semiconducting iron phosphate glasses

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1980
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Cited by 5 publications
(2 citation statements)
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“…Details are given in our previous paper [1 ]. The non-crystalline state of each sample was established by means of X-ray analysis (CoK, radiation).…”
Section: Sample Preparationmentioning
confidence: 99%
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“…Details are given in our previous paper [1 ]. The non-crystalline state of each sample was established by means of X-ray analysis (CoK, radiation).…”
Section: Sample Preparationmentioning
confidence: 99%
“…In our recent paper devoted to the analysis of FeO~-P20 5 glasses, using the thermostimulated depolarization method (TSD) we predicted the presence of microscopic regions of the dispersed phase inserted in the homogeneous matrix of the glass [1]. The mechanism of devitrification, studied in this connection by means of transmission electron microscopy [2], as well as some indirect structural conclusions based on ac and dc characteristics measurements [3] and considerations of the phase separation of phosphate glasses [4,5], assume the existence of several phases.…”
mentioning
confidence: 99%