Commentaries on the selected works of S. A. Chaplygin

Stepanov, G. Yu.

doi:10.1007/bf01089692

Cited by 4 publications

(4 citation statements)

References 1 publication

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“…The reflectivity profile is calculated using XOP (X-ray Oriented Programs) [86], which uses dynamical diffraction theory from Ref. [87], and the result is checked with the X0H program, which calculates crystal susceptibilities χ 0 and χ h [88,89].…”

Section: Experimental Methodsmentioning

confidence: 99%

High-precision measurements of n=2→n=1 transition energies and level widths in He- and Be-like argon ions

et al. 2018

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We performed a reference-free measurement of the transition energies of the 1s2p 1 P 1 → 1s 2 1 S 0 line in He-like argon, and of the 1s2s 2 2p 1 P 1 → 1s 2 2s 2 1 S 0 line in Be-like argon ions. The highlycharged ions were produced in the plasma of an Electron-Cyclotron Resonance Ion Source. Both energy measurements were performed with an accuracy better than 3 parts in 10 6 , using a double flat-crystal spectrometer, without reference to any theoretical or experimental energy. The 1s2s 2 2p 1 P 1 → 1s 2 2s 2 1 S 0 transition measurement is the first reference-free measurement for this core-excited transition. The 1s2p 1 P 1 → 1s 2 1 S 0 transition measurement confirms recent measurement performed at the Heidelberg Electron-Beam Ion Trap (EBIT). The width measurement in the He-like transition provides test of a purely radiative decay calculation. In the case of the Be-like argon transition, the width results from the sum of a radiative channel and three main Auger channels. We also performed Multiconfiguration Dirac-Fock (MCDF) calculations of transition energies and rates and have done an extensive comparison with theory and other experimental data. For both measurements reported here, we find agreement with the most recent theoretical calculations within the combined theoretical and experimental uncertainties.

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Section: Experimental Methodsmentioning

confidence: 99%

High-precision measurements of n=2→n=1 transition energies and level widths in He- and Be-like argon ions

et al. 2018

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“…where θ ref is the angular correction due to refraction (22). Comparison of this expression with the one obtained from the full dynamical theory (see Eq.…”

Section: Quasi-kinematical Approximationmentioning

confidence: 93%

“…For these simulations Fourier components of susceptibilities were obtained from Ref. [22] and all scattering parameters are summarized in Table I. We want to note here that for scattering conditions considered here the extinction length for Si 111 crystal L Si ex = 6.1 µm was about an order of magnitude larger than for Au 111 crystal L Au ex = 610 nm.…”

Section: Simulationsmentioning

confidence: 99%

Phase of transmitted wave in dynamical theory and quasi-kinematical approximation

Gorobtsov

Vartanyants

2016

Phys. Rev. B

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Variation of the phase of the beam transmitted through a crystalline material as a function of the rocking angle is a well-known dynamical effect in x-ray scattering. Unfortunately, it is not so easy to directly measure these phase variations in a conventional scattering experiment. It was recently suggested that the transmitted phase can be directly measured in ptychography experiments performed on nanocrystal samples. Results of such experiment for different crystal thickness, reflections, and incoming photon energies, in principle, can be fully described in the frame of dynamical theory. However, dynamical theory does not provide a simple analytical expression for the further analysis. Here we develop a quasi-kinematical theory approach that allows one to correctly describe the phase of the transmitted beam for the crystal thickness less than extinction length that is beyond applicability of the conventional kinematical theory.

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“…4,[12][13][14] Simulations of the XRD curves were carried out on the web-based server provided by the Argonne National Laboratory. 23) Mechanical models were developed using the FEM code COMSOL multiphysics. The strain in the studied material originates from the displacement fields introduced by subnanometric defects such as hydrogen in bond centered sites, y These authors contributed equally to this work.…”

mentioning

confidence: 99%

Strain in Hydrogen-Implanted Si Investigated Using Dark-Field Electron Holography

Cherkashin

Reboh

Lubk

et al. 2013

Appl. Phys. Express

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The microstructure of ion-implanted crystals is profoundly dictated by mechanical strain developing in interplay with structural defects. Understanding the origin of strain during the early stages of development is challenging and requires accurate measurements and modeling. Here, we investigate the mechanical strain in H-implanted Si. X-ray diffraction analysis is performed to measure the mesoscopic out-of-plane strain and dark-field electron holography to map strain in two-dimensions (2D) with nanometer spatial resolution. Supported by finite element method modeling, we propose that the mean strain field is explained by overlapping and averaging discrete strain fields generated by sub-nanoscopic defects that are intimately related to the H depth concentration.

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Commentaries on the selected works of S. A. Chaplygin

Cited by 4 publications

References 1 publication

High-precision measurements of n=2→n=1 transition energies and level widths in He- and Be-like argon ions

High-precision measurements of n=2→n=1 transition energies and level widths in He- and Be-like argon ions

Phase of transmitted wave in dynamical theory and quasi-kinematical approximation

Strain in Hydrogen-Implanted Si Investigated Using Dark-Field Electron Holography

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