2016
DOI: 10.1016/j.solmat.2015.09.019
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Combining strong interface recombination with bandgap narrowing and short diffusion length in Cu2ZnSnS4 device modeling

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Cited by 59 publications
(44 citation statements)
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“…In the case of PDT(Na), L D increases with NaF thickness up to 100 nm while in the case of PAS(Na), a maximum value of almost 300 nm is found for 15 nm of NaF. These values are consistent with other publications …”
Section: Resultssupporting
confidence: 91%
“…In the case of PDT(Na), L D increases with NaF thickness up to 100 nm while in the case of PAS(Na), a maximum value of almost 300 nm is found for 15 nm of NaF. These values are consistent with other publications …”
Section: Resultssupporting
confidence: 91%
“…The Al 2 O 3 rear surface passivated CZTS solar cell fabrication and characterization sequences are summarized in Table I; for more details concerning the nanostructured Al 2 O 3 passivation layer formation, the general cell processing (e.g., the CZTS absorber layer formation), and a device model of unpassivated reference CZTS solar cells, see [6], [14], and [15]. The unpassivated reference cells have the same processing sequence, but without steps 3 and 4.…”
Section: Methodsmentioning
confidence: 99%
“…In this work we use 1D SCAPS [1] models to simulate the influence of CZTS absorber layer thickness on current-voltage (J-V) characteristics and compare with an empirical data set with similar thickness variations [2]. The models are minor variations to our baseline reference device model [3], built with input parameters from a reference device presented at IEEE PVSC-41 [4]. The aim of this study is to evaluate the trends induced by changing thickness, and to predict the influence of thicknesses variation, for future reference, in the limit of bulk and back contact recombination.…”
Section: Introductionmentioning
confidence: 99%
“…A complete description of the reference model, including the semi-empirical absorption coefficient, can be found in [3].…”
Section: Introductionmentioning
confidence: 99%