Combined X-ray micro-diffraction, radiography and tomography analysis of solid objects

Abstract

In this contribution, we will show examples of the strength of the combination of X-ray (micro-) diffraction, X-ray imaging and Computed Tomography (CT) results on solid objects. New developments-especially in detector technology-allow integration of these techniques on one laboratory X-ray diffraction system. By combining phase analysis with density and microstructure information a complete picture of the sample is obtained. Results can be correlated with macroscopic material properties. Examples from building materials, natural objects and pharmaceutical tablets are shown.