2016
DOI: 10.1017/s1551929516000328
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Combined Tilt- and Focal-Series Tomography for HAADF-STEM

Abstract: Abstract:A new aid to tomography in the scanning transmission electron microscope (STEM) is called combined tilt-and focal-series (CTFS). This software controls the recording of a tilt series where for each specimen tilt an entire focal series is recorded. This approach is particularly useful for thick specimens where the tilt range may be limited. Use of CTFS leads to a significant reduction of the missing wedge effect and a better representation of the 3D shapes of features in the specimen.

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Cited by 1 publication
(2 citation statements)
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“…HAADF-STEM has emerged as a powerful imaging technique that provides nanoscale-level structural detail. , It is, however, sensitive to environmental and instrumental noise during image acquisition that introduces extraneous signals not associated with the scattering of the sample. ,, For example, images are acquired at different projection angles by tilting the sample stage, at high tilt angles; however, focusing becomes more difficult, which leads to image blurring . In addition, limited beam penetration and focal depth coupled with the restricted tilt range results in a lower set of projections which also introduces artifacts (i.e., “missing cone” artifacts). , Beam damage and environmental noise (e.g., airflow, sound, temperature, etc.) also deteriorate image quality and limit the accuracy of HAADF-STEM tomographic reconstruction. ,, Due to the particle nature of electrons and the collection method, Poisson noise remains the dominant form of noise in STEM imaging. , To account for these effects within our simulated data, we apply several HAADF-STEM-related noise conditions including Gaussian noise, Poisson noise, and tip-blurring effects to each simulated image similar to the approach implemented by Schwenker et al Parameters such as broadening effects, counts, and additive background noise were adjusted to account for the different levels of noise that may be encountered during image acquisition.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…HAADF-STEM has emerged as a powerful imaging technique that provides nanoscale-level structural detail. , It is, however, sensitive to environmental and instrumental noise during image acquisition that introduces extraneous signals not associated with the scattering of the sample. ,, For example, images are acquired at different projection angles by tilting the sample stage, at high tilt angles; however, focusing becomes more difficult, which leads to image blurring . In addition, limited beam penetration and focal depth coupled with the restricted tilt range results in a lower set of projections which also introduces artifacts (i.e., “missing cone” artifacts). , Beam damage and environmental noise (e.g., airflow, sound, temperature, etc.) also deteriorate image quality and limit the accuracy of HAADF-STEM tomographic reconstruction. ,, Due to the particle nature of electrons and the collection method, Poisson noise remains the dominant form of noise in STEM imaging. , To account for these effects within our simulated data, we apply several HAADF-STEM-related noise conditions including Gaussian noise, Poisson noise, and tip-blurring effects to each simulated image similar to the approach implemented by Schwenker et al Parameters such as broadening effects, counts, and additive background noise were adjusted to account for the different levels of noise that may be encountered during image acquisition.…”
Section: Methodsmentioning
confidence: 99%
“…31 In addition, limited beam penetration and focal depth coupled with the restricted tilt range results in a lower set of projections which also introduces artifacts (i.e., "missing cone" artifacts). 32,33 Beam damage and environmental noise (e.g., airflow, sound, temperature, etc.) also deteriorate image quality and limit the accuracy of HAADF-STEM tomographic reconstruction.…”
Section: Coarse-grained Molecular Dynamics Simulations Andmentioning
confidence: 99%