“…HAADF-STEM has emerged as a powerful imaging technique that provides nanoscale-level structural detail. , It is, however, sensitive to environmental and instrumental noise during image acquisition that introduces extraneous signals not associated with the scattering of the sample. ,, For example, images are acquired at different projection angles by tilting the sample stage, at high tilt angles; however, focusing becomes more difficult, which leads to image blurring . In addition, limited beam penetration and focal depth coupled with the restricted tilt range results in a lower set of projections which also introduces artifacts (i.e., “missing cone” artifacts). , Beam damage and environmental noise (e.g., airflow, sound, temperature, etc.) also deteriorate image quality and limit the accuracy of HAADF-STEM tomographic reconstruction. ,, Due to the particle nature of electrons and the collection method, Poisson noise remains the dominant form of noise in STEM imaging. , To account for these effects within our simulated data, we apply several HAADF-STEM-related noise conditions including Gaussian noise, Poisson noise, and tip-blurring effects to each simulated image similar to the approach implemented by Schwenker et al − Parameters such as broadening effects, counts, and additive background noise were adjusted to account for the different levels of noise that may be encountered during image acquisition.…”