“…21 In spite of the large number of successful applications of the SMM, a main challenge still remains, namely, the difficulty in mapping the electric permittivity of heterogeneous samples exhibiting large height variations. Until now, most applications have dealt with either heterogeneous 2D planar samples 6,12,22,23 or with homogeneous 3D samples, 24 but they have not addressed the general situation of 3D heterogeneous systems, yet. The emergence of the new 3D electron device technologies (e.g.…”