2017 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C) 2017
DOI: 10.1109/qrs-c.2017.19
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Combinatorial and MC/DC Coverage Levels of Random Testing

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Cited by 8 publications
(2 citation statements)
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“…This technique measures the quality of test cases based on a scenario-based coverage criterion. Recently, Vilkomir et al [16] performed measurements for combinatorial coverage, three cryptographic algorithms are the object of this analysis and the CCM tool is used to measure the combinatorial coverage of random test cases. Since there is a lack of empirical studies measuring combinatorial coverage of manual test cases designed by experienced engineers, we are motivated to investigate this subject in more detail.…”
Section: A Related Work and Backgroundmentioning
confidence: 99%
“…This technique measures the quality of test cases based on a scenario-based coverage criterion. Recently, Vilkomir et al [16] performed measurements for combinatorial coverage, three cryptographic algorithms are the object of this analysis and the CCM tool is used to measure the combinatorial coverage of random test cases. Since there is a lack of empirical studies measuring combinatorial coverage of manual test cases designed by experienced engineers, we are motivated to investigate this subject in more detail.…”
Section: A Related Work and Backgroundmentioning
confidence: 99%
“…Vilkomir et al [21] investigated the coverage achieved by randomly generated test cases for two criteria: MC/DC and combinatorial T-way testing, where T-value varies from 2 to 6. They reported that as the number of test cases increases, the coverage level for both T-way and MC/DC increases.…”
Section: Literature Surveymentioning
confidence: 99%