Abstract:Abstract-It is known that the complexity of automatic test pattern generation (ATPG) for acyclic sequential circuits is similar to that of combinational ATPG. The general problem, however, requires time-frame expansion and multiple-fault detection and hence does not allow the use of available combinational ATPG programs. The first contribution of this work is a combinational single-fault ATPG method for the most general class of acyclic sequential circuits. Without inserting any real hardware, we create a func… Show more
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