Epitaxial LaMnOy thin films have been grown on LaAlO3
(001)/(011)/(111) substrates using an off-axis magnetron sputtering
technique. The influence of the substrate orientation on the structural,
magnetic and transport properties has been investigated systematically. The
lattice constants, lattice mismatch, surface roughness and resistivity of
annealed films increase in the order (111)<(011)<(001). The surface
morphology of the (011) oriented films exhibits a striped structure. The
paramagnetic-ferromagnetic transition temperature (Tc), resistivity
transition temperature (Tp), and magnetoresistance (MR) of the annealed
films increase in the order (001) < (011) < (111). Compared to unannealed
films, the oxygen annealing decreases MR and resistivity, and increases
Tp in the order (111)<(011)<(001). These demonstrate that film
orientation can dramatically affect microstructural, magnetic and transport
properties of LaMnOy thin films.