“…[55] Also, the effect of PBF process parameters, especially beam scanning strategy, on the resulting epitaxial growth of columnar grains has a profound effect on the epitaxy tendency and grain orientation across layers. [56][57][58] Depending on layer rotation (i.e., 0°, 67°or 90°), [59][60][61][62] point or line (raster) heat source, [63] fraction of remelting ratio (RR), [61,64] or specific hatch pattern [65][66][67] adopted in the scanning strategy, the epitaxial growth continuity of columnar grains can vary significantly. SLE process, as a descendant form of SLS process, has been employed to produce a crack-free, dense SX deposit (CMSX-4 alloy), that is, on top of investment-cast SX substrate of similar chemistry.…”