Abstract:Full-field optical coherence microscopy (FF-OCM) is an established optical technology based on low-coherence interference microscopy for high-resolution non-invasive three-dimensional imaging of semi-transparent samples. We present an extension of the technique setting up an achromatic imaging system over a spectral range extending from 530 nm to 1700 nm, to provide tomographic images in three distinct bands centered at 635 nm, 870 nm and 1170 nm. Image contrast enhancement as well as sample characterization i… Show more
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