2012
DOI: 10.1038/nature11296
|View full text |Cite
|
Sign up to set email alerts
|

Collective bulk carrier delocalization driven by electrostatic surface charge accumulation

Abstract: In the classic transistor, the number of electric charge carriers--and thus the electrical conductivity--is precisely controlled by external voltage, providing electrical switching capability. This simple but powerful feature is essential for information processing technology, and also provides a platform for fundamental physics research. As the number of charges essentially determines the electronic phase of a condensed-matter system, transistor operation enables reversible and isothermal changes in the syste… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

17
685
3
4

Year Published

2013
2013
2023
2023

Publication Types

Select...
5
4

Relationship

0
9

Authors

Journals

citations
Cited by 682 publications
(709 citation statements)
references
References 30 publications
17
685
3
4
Order By: Relevance
“…Figure 2b exemplifies the electricdouble-layer transistor (EDLT) gate control of the MIT in VO 2 films 18 ; a clear MIT is observed upon gating, ascribed to the fillingcontrol Mott transition, although its doping mechanism is still controversial 18,19 . As shown in the upper panel of Fig.…”
Section: Mottronicsmentioning
confidence: 99%
“…Figure 2b exemplifies the electricdouble-layer transistor (EDLT) gate control of the MIT in VO 2 films 18 ; a clear MIT is observed upon gating, ascribed to the fillingcontrol Mott transition, although its doping mechanism is still controversial 18,19 . As shown in the upper panel of Fig.…”
Section: Mottronicsmentioning
confidence: 99%
“…[5][6][7][8] In addition, this material has attracted much attention for its potential applications in ultrafast optical and electrical switching. [9][10][11][12][13] Therefore, much effort has been made to modulate the MIT by various approaches such as strain engineering, 14,15 ionic liquid gating, [16][17][18] electric field-induced oxygen vacancy, 19 and chemical doping. [20][21][22][23][24][25] In terms of chemical doping, using metal elements such as tungsten during growth can dramatically change the transition properties 20,26 , but it is an irreversible process.…”
mentioning
confidence: 99%
“…41,42) Electricfield-induced superconductivity was also reported on layered superconductor compounds. 43,44) Electric field-effect switching of ferromagnetism and a charge ordered state was reported on ferromagnetic semiconductors, ferromagnetic thin film metals and oxide thin films, [45][46][47] which suggests that electric field-effect doping will be a standard method to examine the physical properties of a material, similar to high-pressure experiments and high magnetic field experiments. …”
Section: Electric Field-effect Doping On New Systemsmentioning
confidence: 99%