Coherent and incoherent imaging in the scanning transmission electron microscope

Misell, D L; Stroke, George W.; Halioua, Maurice

doi:10.1088/0022-3727/7/10/103

Cited by 22 publications

(4 citation statements)

References 6 publications

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“…The question arises about the exact inner angle of the ADF detector for incoherent imaging. Early calculations (Engel et al, 1974;Misell et al, 1974) suggested that if the ADF detector collected all of the scattered electrons, then the incoherent imaging characteristics would be displayed. Cowley (1973aCowley ( , 1976, however, pointed out that the scattering of high-energy incident electrons by coordinated atoms in a crystalline specimen to an ADF detector might not be a simple summation of independent intensity contributions.…”

Section: Coherent Versus Incoherent Stem Imagingmentioning

confidence: 99%

Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

Liu

2021

Microsc Microanal

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Although scanning transmission electron microscopy (STEM) images of individual heavy atoms were reported 50 years ago, the applications of atomic-resolution STEM imaging became wide spread only after the practical realization of aberration correctors on field-emission STEM/TEM instruments to form sub-Ångstrom electron probes. The innovative designs and advances of electron optical systems, the fundamental understanding of electron–specimen interaction processes, and the advances in detector technology all played a major role in achieving the goal of atomic-resolution STEM imaging of practical materials. It is clear that tremendous advances in computer technology and electronics, image acquisition and processing algorithms, image simulations, and precision machining synergistically made atomic-resolution STEM imaging routinely accessible. It is anticipated that further hardware/software development is needed to achieve three-dimensional atomic-resolution STEM imaging with single-atom chemical sensitivity, even for electron-beam-sensitive materials. Artificial intelligence, machine learning, and big-data science are expected to significantly enhance the impact of STEM and associated techniques on many research fields such as materials science and engineering, quantum and nanoscale science, physics and chemistry, and biology and medicine. This review focuses on advances of STEM imaging from the invention of the field-emission electron gun to the realization of aberration-corrected and monochromated atomic-resolution STEM and its broad applications.

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Section: Coherent Versus Incoherent Stem Imagingmentioning

confidence: 99%

Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

Liu

2021

Microsc Microanal

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“…Many authors have considered imaging approximations for thin specimens in ADF-STEM (for example, Misell et al, 1974;Cowley, 1976;Spence & Cowley, 1978;Jesson & Pennycook, 1993;Treacy & Gibson, 1993;Loane et al, 1992;Hawkes & Kasper, 1994;Bosch & Lazić, 2015). If the STEM probe is small compared to the spacing between the atoms in the specimen and the specimen is thin enough so that the incident electrons do not scatter more than once while going through the specimen, and only electrons scattered to angles larger than the objective aperture are collected (i.e.…”

Section: Incoherent Stem Approximationmentioning

confidence: 99%

Computation in electron microscopy

Kirkland

2016

Acta Crystallogr A Found Adv

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Some uses of the computer and computation in high-resolution transmission electron microscopy are reviewed. The theory of image calculation using Bloch wave and multislice methods with and without aberration correction is reviewed and some applications are discussed. The inverse problem of reconstructing the specimen structure from an experimentally measured electron microscope image is discussed. Some future directions of software development are given.

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“…The pixel by pixel data format can be easily used for spectromicroscopy applications. In the STXM, the contrast transfer function (CTF) follows that one of an incoherent microscope due to the image formation process (pixel by pixel) and due to the fact that normally the detector aperture is equal or larger than that of the zone plate [ 33 ].…”

Section: Reviewmentioning

confidence: 99%

Overview of nanoscale NEXAFS performed with soft X-ray microscopes

Bittencourt¹

2015

Beilstein J. Nanotechnol.

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SummaryToday, in material science nanoscale structures are becoming more and more important. Not only for the further miniaturization of semiconductor devices like carbon nanotube based transistors, but also for newly developed efficient energy storage devices, gas sensors or catalytic systems nanoscale and functionalized materials have to be analysed. Therefore, analytical tools like near-edge X-ray absorption fine structure (NEXAFS) spectroscopy has to be applied on single nanostructures. Scanning transmission X-ray microscopes (STXM) as well as full-field transmission X-ray microscopes (TXM) allow the required spatial resolution to study individual nanostructures. In the soft X-ray energy range only STXM was used so far for NEXAFS studies. Due to its unique setup, the TXM operated by the Helmholtz-Zentrum Berlin (HZB) at the electron storage ring BESSY II is the first one in the soft X-ray range which can be used for NEXAFS spectroscopy studies which will be shown in this review. Here we will give an overview of the different microscopes used for NEXAFS studies and describe their advantages and disadvantages for different samples.

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Coherent and incoherent imaging in the scanning transmission electron microscope

Cited by 22 publications

References 6 publications

Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy

Computation in electron microscopy

Overview of nanoscale NEXAFS performed with soft X-ray microscopes

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