Proceedings of the 28th Annual International Computer Software and Applications Conference, 2004. COMPSAC 2004.
DOI: 10.1109/cmpsac.2004.1342705
|View full text |Cite
|
Sign up to set email alerts
|

Code-coverage guided prioritized test generation

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
9
0

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 5 publications
(9 citation statements)
references
References 6 publications
0
9
0
Order By: Relevance
“…For example, Li et al [53] propose a method for guiding users through test case generation. An experiment of this method showed a good result regarding test effort reduction.…”
Section: Category Automationmentioning
confidence: 99%
“…For example, Li et al [53] propose a method for guiding users through test case generation. An experiment of this method showed a good result regarding test effort reduction.…”
Section: Category Automationmentioning
confidence: 99%
“…Another necessary improvement to the method of [7] is test data generation. The original test generation method generates one data value set so that the intended program point can be reached at least once after the value set is passed as parameters into the test execution.…”
Section: B Automatic Testermentioning
confidence: 99%
“…Repeat this process of test generation and execution until defects are detected by at least one failed test or all high-priority code is fully covered by test cases. The method given in [7] generates test cases to cover highest priority code, where priority means higher code coverage. We replace its priority calculation, based on code coverage potential of each program line, with our dpv calculation that indicates failure potential of each line.…”
Section: B Automatic Testermentioning
confidence: 99%
See 2 more Smart Citations