COD Measurement of Moving and Stationary Crack in Silicon Nitride Using Digital Image Correlation Method

Nishikawa, Izuru; Ogura, Keiji; Kunimatsu, Shinya; Nishi, Keisuke

doi:10.1299/jsmekansai.2002.77._2-37_

The Proceedings of Conference of Kansai Branch

2002

DOI: 10.1299/jsmekansai.2002.77._2-37_

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COD Measurement of Moving and Stationary Crack in Silicon Nitride Using Digital Image Correlation Method

Izuru Nishikawa

Keiji Ogura

Shinya Kunimatsu

et al.

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COD Measurement of Moving and Stationary Crack in Silicon Nitride Using Digital Image Correlation Method

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