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2015
DOI: 10.1016/j.jallcom.2014.10.183
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Cobalt sulfide thin films: Chemical growth, reaction kinetics and microstructural analysis

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Cited by 22 publications
(17 citation statements)
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“…Sharp reflection peaks highlight formation of polycrystalline CoS thin films with (Jaipurite) hexagonal crystal structure of space group P63/mmc. The observed values of lattice parameters, intensities of reflections and d-values have good consonance with the JCPD values (JCPDS: 03-065-0407) and earlier reports [8,11]. The existence of single reflection plane (5 1 1) at 2h = 59.32°suggested the presence of Co 3 O 4 impurity.…”
Section: Compositional and Structural Studiessupporting
confidence: 90%
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“…Sharp reflection peaks highlight formation of polycrystalline CoS thin films with (Jaipurite) hexagonal crystal structure of space group P63/mmc. The observed values of lattice parameters, intensities of reflections and d-values have good consonance with the JCPD values (JCPDS: 03-065-0407) and earlier reports [8,11]. The existence of single reflection plane (5 1 1) at 2h = 59.32°suggested the presence of Co 3 O 4 impurity.…”
Section: Compositional and Structural Studiessupporting
confidence: 90%
“…In general, growth by the chemical bath deposition proceeds at a moderate ion release rate and ions react with each other to form the nuclei either by spontaneous precipitation or significantly slowly in a highly alkaline medium [1][2][3][8][9][10][11]. Rigorous precipitation assures no film formation on the immersed substrates; alternatively, if the rate of precipitation is controlled, nuclei could get adequate time and chance to initiate the film formation process and hence layer growth onto the substrate surface.…”
Section: Resultsmentioning
confidence: 99%
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