“…In particular, works (Garbolino & Hlawiczka, 2002) and (Garbolino & Papa, 2008) present some concepts of optimizing the LFSR structure containing D-type and T-type flip-flops for generation of deterministic test pattern sets. Evolutionary stochastic techniques for the optimization of hardware are widely used (Bolzani et al, 2007;Drechsler & Drechsler, 2002;Guo et al, 2007;Mazumder & Rudnick, 1999). In a software-based methodology that automatically generates test programs is described.…”