Co-evolution of test programs and stimuli vectors for testing of embedded peripheral cores

Bolzani, L.; Sánchez, Ernesto; Schillaci, Massimiliano; Squillero, Giovanni

doi:10.1109/cec.2007.4424922

Cited by 5 publications

(2 citation statements)

References 13 publications

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“…Several papers cover the use of evolutionary techniques in the optimization of hardware [10,24,31,41]. In [37] a software-based methodology that automatically generates test programs is described.…”

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confidence: 99%

Genetic algorithm for test pattern generator design

Papa

2010

Appl Intell

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The paper describes an approach for the generation of a deterministic test pattern generator logic, which is composed of D-type and T-type flip-flops. This approach employs a genetic algorithm that searches for an acceptable practical solution in a large space of possible implementations. In contrast to conventional approaches the proposed one reduces the gate count of a built-in self-test structure by concurrent optimization of multiple parameters that influence the final solution. The optimization includes the search for: the optimal combination of register cells type; the presence of inverters at inputs and outputs; the test patterns order in the generated test sequence; and the bit order of test patterns. Results of benchmark experiments and comparison with similar studies demonstrate the efficiency of the proposed evolutionary approach.

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confidence: 99%

Genetic algorithm for test pattern generator design

Papa

2010

Appl Intell

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“…In particular, works (Garbolino & Hlawiczka, 2002) and (Garbolino & Papa, 2008) present some concepts of optimizing the LFSR structure containing D-type and T-type flip-flops for generation of deterministic test pattern sets. Evolutionary stochastic techniques for the optimization of hardware are widely used (Bolzani et al, 2007;Drechsler & Drechsler, 2002;Guo et al, 2007;Mazumder & Rudnick, 1999). In a software-based methodology that automatically generates test programs is described.…”

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confidence: 99%