2019
DOI: 10.3390/ijms20153749
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Clustered DNA Damages induced by 0.5 to 30 eV Electrons

Abstract: Low-energy electrons (LEEs) of energies ≤30 eV are generated in large quantities by ionizing radiation. These electrons can damage DNA; particularly, they can induce the more detrimental clustered lesions in cells. This type of lesions, which are responsible for a large portion of the genotoxic stress generated by ionizing radiation, is described in the Introduction. The reactions initiated by the collisions of 0.5–30 eV electrons with oligonucleotides, duplex DNA, and DNA bound to chemotherapeutic platinum dr… Show more

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Cited by 21 publications
(26 citation statements)
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“…The computational time of the simulation for a population of cells is also a big concern. MCTS codes are also not capable enough to reliably simulate the very low energy secondary electrons below about 10 eV, which are considered as potential lethal sources for the cell since they can induce harmful clustered lesions in the DNA [94,95].…”
Section: Particle Track Structure Codesmentioning
confidence: 99%
“…The computational time of the simulation for a population of cells is also a big concern. MCTS codes are also not capable enough to reliably simulate the very low energy secondary electrons below about 10 eV, which are considered as potential lethal sources for the cell since they can induce harmful clustered lesions in the DNA [94,95].…”
Section: Particle Track Structure Codesmentioning
confidence: 99%
“…Although works from the late 70′s to date have established that radiation-produced electrons in their various stages exhibit different reactivity towards DNA subunits-bases and the sugar-phosphate backbone—this field is hence under active debate [4,8,29,30,31,38,39,45,56,57,58,59,60,61,62,63,64,70,71,72,73,74,75,88,96,97,98,99,100,101,102,103,104,105,106,107,108,109,110,111,112,113]. The consensus that emerged from extensive studies by various groups are the following:…”
Section: Ultrafast Hole and Electron Transfer Under Irradiationmentioning
confidence: 99%
“…4 eV can induce SSBs in plasmid DNA via DEA. Recently, the Sanche group has provided evidence that LEEs (0.5 to 30 eV) can lead to clustered lesions [102]. Extensive experimental and theoretical studies have established that the initial step involves electron capture into the unoccupied molecular orbitals that are above the lowest unoccupied molecular orbitals (LUMOs) of the parent nucleobase.…”
Section: Ultrafast Hole and Electron Transfer Under Irradiationmentioning
confidence: 99%
“…The type of damages induce by LEEs in DNA has been analyzed in detail by various techniques. It includes, base damage and cleavage, single and double strand breaks and other clustered lesions, consisting of strand breaks and base damages [11,[13][14][15][16]. Similar damages were observed and enhanced when GNPs were bound to DNA [17][18][19][20].…”
Section: Introductionmentioning
confidence: 74%