Close-spaced evaporated ZnSe films: Preparation and characterization

Structural and optical characteristics of ZnSe and CdSe films condensed on non-oriented substrates

“…It was observed a decrease of the period with increasing the condensation temperature of material up to T s ~ 770 K, with the following increase of a to the values presented in JCPDS (а = 0.56688 nm). These results are well-correlated with the experimental data а = 0.566…0.571 nm obtained for (111) line of films deposited using the CSVS method by the authors of [14].…”

“…The only works [14][15][16][17][18] were devoted to study these films. But in [15], the authors studied only structural characteristics of ZnSe films obtained at room temperature.…”

“…But in [15], the authors studied only structural characteristics of ZnSe films obtained at room temperature. More fundamental research was carried out in [14] for films deposited at substrate temperatures 473 to 623 K. Some structural and optical characteristics of CdSe films were investigated in [16]. There these condensates were obtained in the narrow range of substrate temperatures 290 to 490 K. It should be noted that the measurement of lattice constants and substructural characteristics of ZnSe and CdSe films was done by the authors along (111) line at small angles that resulted in considerable mistakes in determining these characteristics.…”

“…There these condensates were obtained in the narrow range of substrate temperatures 290 to 490 K. It should be noted that the measurement of lattice constants and substructural characteristics of ZnSe and CdSe films was done by the authors along (111) line at small angles that resulted in considerable mistakes in determining these characteristics. In the works [14][15][16], a complex approach for studying the film properties is absent.…”

Influence of substrate temperature on the properties of electron beam evaporated ZnSe films

“…An increase in the height of the XRD peak indicates preferred orientation which in turn is expected to enhance considerably the reduction process of the imperfections originating from lattice misfit in the EB evaporated ZnSe films. Venkatasubbaiah et al [22] have observed the same defect characteristics for the ZnSe films prepared by the close space evaporation technique. A close analysis of the dependence of the above microstructural parameters on the substrate temperature indicates that the degree of preferred orientation along with the other microstructural features are more prominent than the crystallite size for films with low thickness.…”