Proceedings of the 27th Symposium on Integrated Circuits and Systems Design 2014
DOI: 10.1145/2660540.2660978
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Abstract: The continuously progressing technology scaling is not only the source for increasing performance and complexity of embedded systems, but also the reason for rising reliability concerns of the underlying hardware. Consequently, numerous techniques emerged in recent years to mitigate wide range of error causes. Single layer methods, though, proved to be limited in providing an effective and efficient way to address errors in the system perspective. This paper proposes the new technology Cross-Layer Error Verifi… Show more

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