Classification of Scanning Probe Microscopies

Friedbacher, Gernot; Fuchs, Harald

doi:10.1351/pac199971071337

Cited by 58 publications

(10 citation statements)

References 118 publications

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“…AFM (4) and related techniques (5) have gained increasing importance in many fields of research and industrial applications. Raster scanning the sample with a sharp tip attached to the end of the microfabricated cantilever allows not only the visualization of objects in shape and size of single molecules, but also the ability to touch and squeeze, pull and push them (6).…”

mentioning

confidence: 99%

Inverting dynamic force microscopy: From signals to time-resolved interaction forces

Stärk

Stark

Heckl

et al. 2002

Proc. Natl. Acad. Sci. U.S.A.

194

149

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Transient forces between nanoscale objects on surfaces govern friction, viscous flow, and plastic deformation, occur during manipulation of matter, or mediate the local wetting behavior of thin films. To resolve transient forces on the (sub) microsecond time and nanometer length scale, dynamic atomic force microscopy (AFM) offers largely unexploited potential. Full spectral analysis of the AFM signal completes dynamic AFM. Inverting the signal formation process, we measure the time course of the force effective at the sensing tip. This approach yields rich insight into processes at the tip and dispenses with a priori assumptions about the interaction, as it relies solely on measured data. Force measurements on silicon under ambient conditions demonstrate the distinct signature of the interaction and reveal that peak forces exceeding 200 nN are applied to the sample in a typical imaging situation. These forces are 2 orders of magnitude higher than those in covalent bonds.T ime-dependent forces mediate adsorption, ordering phenomena, and visco-elasticity that are important in rheology and tribology, as well as in biology and catalysis. The importance of dynamic aspects becomes obvious when looking at the viscoelastic properties of polymers (1, 2). Even on the level of a single biomolecule under external stress, velocity dependence can be observed: the stability of the molecule increases with the applied force rate (3). However, dynamic forces occurring during processes at surfaces, in thin and confined lubrication films, or on the level of nanoscopic objects are experimentally not easily accessible.In this context, atomic force microscopy (AFM) offers a large potential to investigate and manipulate material at the (sub) microsecond time scales and nanometer length scale. AFM (4) and related techniques (5) have gained increasing importance in many fields of research and industrial applications. Raster scanning the sample with a sharp tip attached to the end of the microfabricated cantilever allows not only the visualization of objects in shape and size of single molecules, but also the ability to touch and squeeze, pull and push them (6). In dynamic force microscopy, the motion of the cantilever is externally modulated. In tapping-mode AFM, the most common dynamic mode, the cantilever is excited to oscillate at its fundamental resonant frequency. Once each oscillation cycle, the tip interacts with the surface, and information about the tip-sample interaction is transferred into the time course of the signal. The signal formation process is depicted in Fig. 1, and the inset shows schematically the setup of tapping-mode AFM.To obtain the acting forces from the dynamics of the oscillating cantilever, there are basically two routes. First, under ultra high vacuum conditions, the change of the resonant frequency of the force-coupled cantilever is used to estimate the interaction potential (7-9). These methods highly depend on the high quality factor of the oscillation under ultra high vacuum. Second, under ambient condi...

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mentioning

confidence: 99%

Inverting dynamic force microscopy: From signals to time-resolved interaction forces

Stärk

Stark

Heckl

et al. 2002

Proc. Natl. Acad. Sci. U.S.A.

194

149

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“…STM can operate in ultra-high vacuum allowing characterization in liquid and gaseous suspensions; 60 Microscopic techniques are the most employed characterization tools as they create surface images using a physical probe that scans the specimen.…”

Section: Size Determinationmentioning

confidence: 99%

“…60 Some studies made with silver NPs proved that the ultrafiltration method was more efficient and effective, providing greater size control, concentration, and aggregation state in comparison with conventional isolation methods such as ultracentrifugation. This technique is fast and requires little sample preparation.…”

Section: Ultrafiltration (Uf)mentioning

confidence: 99%

Nanoparticles: a global vision. Characterization, separation, and quantification methods. Potential environmental and health impact

et al. 2014

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“…In addition, ion irradiation may cause ablation of the a-SiC:H, leading to changes of the topographic features of the surface. Therefore a technique to map the topographic features of the patterns, such as atomic force microscopy (AFM) [16,17] is also necessary to characterize the modified surfaces. From these points of view, scanning near-field optical microscopy (SNOM) [17][18][19], with the shear force technique that provides topographic data, is a promising method that can obtain both optical and topographic images of the sample simultaneously.…”

Section: Introductionmentioning

confidence: 99%

Optical Pattern Fabrication in Amorphous Silicon Carbide with High-Energy Focused Ion Beams

et al. 2011

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Topographic and optical patterns have been fabricated in a-SiC films with a focused high-energy (1 MeV) H + and He + ion beam and examined with near-field techniques. The patterns have been characterized with atomic force microscopy and scanning near-field optical microscopy to reveal local topography and optical absorption changes as a result of the focused high-energy ion beam induced modification. Apart of a considerable thickness change (thinning tendency), which has been observed in the ion-irradiated areas, the near-field measurements confirm increases of optical absorption in these areas. Although the size of the fabricated optical patterns is in the micron-scale, the present development of the technique allows in principle writing optical patterns up to the nanoscale (several tens of nanometers). The observed values of the optical contrast modulation are sufficient to justify the efficiency of the method for optical data recording using high-energy focused ion beams.

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Classification of Scanning Probe Microscopies

Cited by 58 publications

References 118 publications

Inverting dynamic force microscopy: From signals to time-resolved interaction forces

Inverting dynamic force microscopy: From signals to time-resolved interaction forces

Nanoparticles: a global vision. Characterization, separation, and quantification methods. Potential environmental and health impact

Optical Pattern Fabrication in Amorphous Silicon Carbide with High-Energy Focused Ion Beams

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