Classification of optical surface properties and material recognition using multi-spectral BRDF data measured with a semi-hemispherical spectro-radiometer in VIS and NIR

Hahlweg, Cornelius; Rothe, Hendrik

doi:10.1117/12.624838

Cited by 7 publications

(18 citation statements)

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“…The sample and the sample holder always cover a certain part of the hemisphere and therefore of the scatter or radiation pattern -a problem which is already described in earlier papers 10,11 .…”

Section: Completion Of Missing Parts Of the Hemispherementioning

confidence: 97%

“…The working principle of the elliptical mirror is based on the simple optical characteristics that every beam of light which passes the focal point F 1 will be reflected on the mirror and will pass the focal point F 2 . The basic design criteria for the catadioptric imaging system are discussed in 10,11 .…”

Section: Device Geometry Optics and Hardware Device Conceptmentioning

confidence: 99%

“…In further development of a full-hemispherical spectro-radiometer based on an elliptical mirror for the VIS range 1,2,3,4,6,8,9,10,11 an angular resolved IR radiometer has been built and tested. Depending on the desired wavelength range various imaging sensors can be used.…”

Section: Introductionmentioning

confidence: 99%

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Hemispherical radiometer for angle resolved measurement of IR scatter and radiation behaviour

Hahlweg

Rothe

2006

SPIE Proceedings

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For certain applications the angular distribution of IR radiation from materials and surfaces could be interesting. Various cases have to be taken into account, such as passive scattering, active radiation from material at a given temperature or the response to a thermal excitation. In further development of a full hemispherical scatterometrical device based on an elliptical mirror, an angular resolved IR radiometer has been developed. In contradiction to traditional goniometer designes the set-up allows to measure a hemispherical radiation distribution without moving parts. One application could be the fast acquisition of large amounts of BRDF data in IR range to be compiled into libraries. The use of imaging sensors reduces the measurement time, therefore even time dependence could be addressed. The paper deals with the instrument design, the calibration, and gives some measurement results.

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Section: Completion Of Missing Parts Of the Hemispherementioning

confidence: 97%

Section: Device Geometry Optics and Hardware Device Conceptmentioning

confidence: 99%

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Hemispherical radiometer for angle resolved measurement of IR scatter and radiation behaviour

Hahlweg

Rothe

2006

SPIE Proceedings

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“…(2). Since most of the surfaces existing in the actual projects are not composed by one single kind of material, the surface roughness is not unique, and the other optical parameters such as incident angle and reflected angle are not unanimous [9] [10].…”

Section: A the Five-parameter Modelmentioning

confidence: 98%

“…As a physical function to describe the scattering characteristics of object surface, it has a widespread application in remote sensing and radiant calibration [2]. BRDF is theoretically a multivariable function of lighting direction, observed direction, wavelength, etc.…”

Section: Introductionmentioning

confidence: 99%

Research on the model of spectral BRDF for space target surface material

Sun

Yuan

Zhang

et al. 2010

2010 International Symposium on Optomechatronic Technologies

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In this paper, a five-parameter statistic model of spectral Bidirectional Reflectance Distribution Function (BRDF), which contains both of specular and diffuse reflection factors, is introduced for space target surface material. The optimal five parameters of the model at different wavelength are independently retrieved by using simulated annealing algorithm (SAA). An absolute measurement method of BRDF data is presented. A spectral radiation meter with 3nm resolution and a three-dimensional rotating system with 0.01° accuracy are utilized to establish the automatic measurement platform. The spectral BRDF data of typical space target sample (silver tinfoil) is measured in the range of 380-2500nm. The modeling results are coincided with the measured results, which verifies the validity of five-parameter statistic model.

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Non-goniometric scatterometry: a review

Hahlweg

Rothe

2007

Polarization Science and Remote Sensing III

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Classification of optical surface properties and material recognition using multi-spectral BRDF data measured with a semi-hemispherical spectro-radiometer in VIS and NIR

Cited by 7 publications

References 0 publications

Hemispherical radiometer for angle resolved measurement of IR scatter and radiation behaviour

Hemispherical radiometer for angle resolved measurement of IR scatter and radiation behaviour

Research on the model of spectral BRDF for space target surface material

Non-goniometric scatterometry: a review

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